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標題: Correlated Electric Fluctuations in GaN Nanowire Devices
作者: Li, L.C.;Huang, S.Y.;Wei, J.A.;Suen, Y.W.;Lee, M.W.;Hsieh, W.H.;Liu, T.W.;Chen, C.C.
關鍵字: Noise;Low-Frequency Excess Noise;GaN Nanowire;Electric Fluctuation;Correlation;Cross Spectrum;1/f noise;carbon nanotubes
日期: 2009
Issue Date: 2012-12-07 17:02:05 (UTC+8)
關連: Journal of Nanoscience and Nanotechnology, Volume 9, Issue 2, Page(s) 1000-1003.
摘要: We report an experimental study on the correlation spectrums between different sections of a multicontact GaN nanowire device. Our results indicate that there exists a negative correlation between the voltage fluctuations of adjacent sections of the nanowire separated by a metal contact in the transition region between the low-frequency 1/f noise and the high-frequency white thermal noise. We suggest that this correlation is caused by the voltage fluctuation under the contact area.
Relation: Journal of Nanoscience and Nanotechnology
Appears in Collections:[依資料類型分類] 期刊論文
[依教師分類] 李明威
[依教師分類] 李明威

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